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Opto Edu A62.4503 Atomic Force Microscope Research Level 360 Angle

    Buy cheap Opto Edu A62.4503 Atomic Force Microscope Research Level 360 Angle from wholesalers
     
    Buy cheap Opto Edu A62.4503 Atomic Force Microscope Research Level 360 Angle from wholesalers
    • Buy cheap Opto Edu A62.4503 Atomic Force Microscope Research Level 360 Angle from wholesalers

    Opto Edu A62.4503 Atomic Force Microscope Research Level 360 Angle

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    Brand Name : OPTO-EDU
    Model Number : A62.4503
    Certification : CE, Rohs
    Price : FOB $1~1000, Depend on Order Quantity
    Payment Terms : L/C, T/T, Western Union
    Supply Ability : 5000 pcs/ Month
    Delivery Time : 5~20 Days
    • Product Details
    • Company Profile

    Opto Edu A62.4503 Atomic Force Microscope Research Level 360 Angle

    Research Level Atomic Force Microscope

    • Research Level, Combined controller & main body design, with Contact Mode, Tapping Mode, 10x Objective.
    • Precision laser and probe positioning device, it is simple and convenient to replace the probe and adjust the spot
    • High-precision and large-scale piezoelectric ceramic scanners can be selected according to different accuracy and scanning range requirements
    • Optical positioning of 10X APO objective lens, no need to focus, real-time observation and positioning of the probe sample scanning area;
    • The spring suspension shockproof method is simple and practical, and has strong anti-interference ability.
    • ◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong

    • ◆ Precision probe positioning device, laser spot alignment adjustment is very easy

      ◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan

      ◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample


    • ◆ High-precision and wide-ranging piezoelectric ceramic scanners can be freely selected

      ◆ High-magnification objective lens automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area

    • ◆ Spring suspension shockproof method, simple and practical, good shockproof effect

      ◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment

    • ◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

    • SpecificationA62.4500A622.4501A62.4503A62.4505
      Work ModeTapping Mode

      【Optional】
      Contact Mode
      Friction Mode
      Phase Mode
      Magnetic Mode
      Electrostatic Mode
      Contact Mode
      Tapping Mode

      【Optional】
      Friction Mode
      Phase Mode
      Magnetic Mode
      Electrostatic Mode
      Contact Mode
      Tapping Mode

      【Optional】
      Friction Mode
      Phase Mode
      Magnetic Mode
      Electrostatic Mode
      Contact Mode
      Tapping Mode

      【Optional】
      Friction Mode
      Phase Mode
      Magnetic Mode
      Electrostatic Mode
      Current Spectrum CurveRMS-Z Curve

      【Optional】
      F-Z Force Curve
      RMS-Z Curve
      F-Z Force Curve
      RMS-Z Curve
      F-Z Force Curve
      RMS-Z Curve
      F-Z Force Curve
      XY Scan Range20×20um20×20um50×50um50×50um
      XY Scan Resolution0.2nm0.2nm0.2nm0.2nm
      Z Scan Range2.5um2.5um5um5um
      Y Scan Resolution0.05nm0.05nm0.05nm0.05nm
      Scan Speed0.6Hz~30Hz0.6Hz~30Hz0.6Hz~30Hz0.6Hz~30Hz
      Scan Angle0~360°0~360°0~360°0~360°
      Sample SizeΦ≤90mm
      H≤20mm
      Φ≤90mm
      H≤20mm
      Φ≤90mm
      H≤20mm
      Φ≤90mm
      H≤20mm
      XY Stage Moving15×15mm15×15mm25×25um25×25um
      Shock-Absorbing DesignSpring SuspensionSpring Suspension
      Metal Shielding Box
      Spring Suspension
      Metal Shielding Box
      -
      Optical Syestem4x Objective
      Resolution 2.5um
      4x Objective
      Resolution 2.5um
      10x Objective
      Resolution 1um
      Eyepiece 10x
      Infinity Plan LWD APO 5x10x20x50x
      5.0M Digital Camera
      10" LCD Monitor, With Measuring
      LED Kohler Illumination
      Coaxial Coarse & Fine Focusing
      OutputUSB2.0/3.0USB2.0/3.0USB2.0/3.0USB2.0/3.0
      SoftwareWin XP/7/8/10Win XP/7/8/10Win XP/7/8/10Win XP/7/8/10
    • MicroscopeOptical MicroscopeElectron MicroscopeScanning Probe Microscope
      Max Resolution (um)0.180.000110.00008
      RemarkOil immersion 1500xImaging diamond carbon atomsImaging high-order graphitic carbon atoms
    • Probe-Sample InteractionMeasure SignalInformation
      ForceElectrostatic ForceShape
      Tunnel CurrentCurrentShape, Conductivity
      Magnetic ForcePhaseMagnetic Structure
      Electrostatic ForcePhasecharge distribution
    •  ResolutionWorking ConditionWorking TemperationDamge to SampleInspection Depth
      SPMAtom Level 0.1nmNormal, Liquid, VacuumRoom or Low TemperationNone1~2 Atom Level
      TEMPoint 0.3~0.5nm
      Lattice 0.1~0.2nm
      High VaccumRoom TemperationSmallUsually <100nm
      SEM6-10nmHigh VaccumRoom TemperationSmall10mm @10x
      1um @10000x
      FIMAtom Level 0.1nmSuper High Vaccum30~80KDamgeAtom Thickness

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