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Opto Edu A62.4511 Scanning Microscope Contact Tapping Mode Plane Atomic Force

    Buy cheap Opto Edu A62.4511 Scanning Microscope Contact Tapping Mode Plane Atomic Force from wholesalers
     
    Buy cheap Opto Edu A62.4511 Scanning Microscope Contact Tapping Mode Plane Atomic Force from wholesalers
    • Buy cheap Opto Edu A62.4511 Scanning Microscope Contact Tapping Mode Plane Atomic Force from wholesalers

    Opto Edu A62.4511 Scanning Microscope Contact Tapping Mode Plane Atomic Force

    Ask Lasest Price
    Brand Name : OPTO-EDU
    Model Number : A62.4511
    Certification : CE, Rohs
    Price : FOB $1~1000, Depend on Order Quantity
    Payment Terms : L/C, T/T, Western Union
    Supply Ability : 5000 pcs/ Month
    Delivery Time : 5~20 Days
    • Product Details
    • Company Profile

    Opto Edu A62.4511 Scanning Microscope Contact Tapping Mode Plane Atomic Force

    Plane Scanning Atomic Force Microscope

    • Gantry scanning head design, marble base, vacuum adsorption stage, sample size and weight are basically unlimited
    • A62.4510 + Closed-loop three-axis independent pressure shift scanner, which can scan with high precision in a wide range
    • Intelligent needle feeding method with automatic detection of motor-controlled piezoelectric ceramics to protect probes and samples
    • Automatic optical positioning, no need to adjust focus, real-time observation and positioning probe sample scanning area
    • Equipped with closed metal shield, pneumatic shock-absorbing table, strong anti-interference ability

    ◆ The first commercial atomic force microscope in China to realize combined mobile scanning of probe and sample;

    ◆ The first in China to use a three-axis independent closed-loop piezoelectric shift scanning table to achieve large-scale high-precision scanning;

    ◆ Three-axis independent scanning, XYZ does not affect each other, very suitable for three-dimensional material and topography detection;

    ◆ Electric control of sample moving table and lifting table, which can be programmed with multi-point position to realize fast automatic detection;

    ◆ Gantry scanning head design, marble base, vacuum adsorption and magnetic adsorption stage;

    ◆ The motor automatically controls the intelligent needle feeding method of the piezoelectric ceramic automatic detection to protect the probe and the sample;

    ◆ High magnification auxiliary optical microscope positioning, real-time observation and positioning of probe and sample scanning area;

    ◆ The closed-loop piezoelectric scanning stage does not require nonlinear correction, and the nanometer characterization and measurement accuracy is better than 99.5%.

    •  A62.4510A62.4511
      Work ModeContact Mode
      Tapping Mode

      【Optional】
      Friction Mode
      Phase Mode
      Magnetic Mode
      Electrostatic Mode
      Contact Mode
      Tapping Mode

      【Optional】
      Friction Mode
      Phase Mode
      Magnetic Mode
      Electrostatic Mode
      Current Spectrum CurveRMS-Z Curve
      F-Z Force Curve
      RMS-Z Curve
      F-Z Force Curve
      XY Scan ModeProbe Driven Scanning,
      Piezo Tube Scanner
      Sample Driven Scanning, Closed Loop Piezoelectric Shift Scanning Stage
      XY Scan Range70×70umClosed Loop 100×100um
      XY Scan Resolution0.2nmClosed Loop 0.5nm
      Z Scan ModeProbe Driven Scanning
      Z Scan Range5um5um
      Z Scan Resolution0.05nm0.05nm
      Scan Speed0.6Hz~30Hz0.6Hz~30Hz
      Scan Angle0~360°0~360°
      Sample Weight≤15Kg≤0.5Kg
      Stage SizeDia.100mm

      【Optional】
      Dia.200mm
      Dia.300mm
      Dia.100mm

      【Optional】
      Dia.200mm
      Dia.300mm
      Stage XY Moving100x100mm, Resolution 1um

      【Optional】
      200x200mm
      300x300mm
      100x100mm, Resolution 1um

      【Optional】
      200x200mm
      300x300mm
      Stage Z Moving15mm, Resolution 10nm
      【Optional】
      20mm
      25mm
      15mm, Resolution 10nm
      【Optional】
      20mm
      25mm
      Shock-Absorbing DesignSpring Suspension

      【Optional】
      Active Shock Absorber
      Spring Suspension

      【Optional】
      Active Shock Absorber
      Optical SystemObjective 5x
      5.0M Digital Camera

      【Optional】
      Objective 10x
      Objective 20x
      Objective 5x
      5.0M Digital Camera

      【Optional】
      Objective 10x
      Objective 20x
      OutputUSB2.0/3.0USB2.0/3.0
      SoftwareWin XP/7/8/10Win XP/7/8/10
      Main BodyGantry Scan Head, Marble BaseGantry Scan Head, Marble Base
    • MicroscopeOptical MicroscopeElectron MicroscopeScanning Probe Microscope
      Max Resolution (um)0.180.000110.00008
      RemarkOil immersion 1500xImaging diamond carbon atomsImaging high-order graphitic carbon atoms
    • Probe-Sample InteractionMeasure SignalInformation
      ForceElectrostatic ForceShape
      Tunnel CurrentCurrentShape, Conductivity
      Magnetic ForcePhaseMagnetic Structure
      Electrostatic ForcePhasecharge distribution
    •  ResolutionWorking ConditionWorking TemperationDamge to SampleInspection Depth
      SPMAtom Level 0.1nmNormal, Liquid, VacuumRoom or Low TemperationNone1~2 Atom Level
      TEMPoint 0.3~0.5nm
      Lattice 0.1~0.2nm
      High VaccumRoom TemperationSmallUsually <100nm
      SEM6-10nmHigh VaccumRoom TemperationSmall10mm @10x
      1um @10000x
      FIMAtom Level 0.1nmSuper High Vaccum30~80KDamgeAtom Thickness

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