Basic Level Atomic Force Microscope

• Basic Level, Separate controller & main body design, with Contact Mode, Tapping Mode, 4x Objective
• The scanning probe and the sample stage are integrated, and the anti-interference ability is strong
• 2. Precision laser and probe positioning device, it is simple and convenient to replace the probe and adjust the spot;
• 4X objective lens optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area
• The spring suspension shockproof method is simple and practical, and has strong anti-interference ability
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• ◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong

  ◆ Precision probe positioning device, laser spot alignment adjustment is very easy

• ◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan

  ◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample

• ◆ Automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area

  ◆ Spring suspension shockproof method, simple and practical, good shockproof effect

  ◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment

• ◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

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• Specification	A62.4500	A622.4501	A62.4503	A62.4505
  Work Mode	Tapping Mode 【Optional】 Contact Mode Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode	Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode
  Current Spectrum Curve	RMS-Z Curve 【Optional】 F-Z Force Curve	RMS-Z Curve F-Z Force Curve	RMS-Z Curve F-Z Force Curve	RMS-Z Curve F-Z Force Curve
  XY Scan Range	20×20um	20×20um	50×50um	50×50um
  XY Scan Resolution	0.2nm	0.2nm	0.2nm	0.2nm
  Z Scan Range	2.5um	2.5um	5um	5um
  Y Scan Resolution	0.05nm	0.05nm	0.05nm	0.05nm
  Scan Speed	0.6Hz~30Hz	0.6Hz~30Hz	0.6Hz~30Hz	0.6Hz~30Hz
  Scan Angle	0~360°	0~360°	0~360°	0~360°
  Sample Size	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm	Φ≤90mm H≤20mm
  XY Stage Moving	15×15mm	15×15mm	25×25um	25×25um
  Shock-Absorbing Design	Spring Suspension	Spring Suspension Metal Shielding Box	Spring Suspension Metal Shielding Box	-
  Optical Syestem	4x Objective Resolution 2.5um	4x Objective Resolution 2.5um	10x Objective Resolution 1um	Eyepiece 10x Infinity Plan LWD APO 5x10x20x50x 5.0M Digital Camera 10" LCD Monitor, With Measuring LED Kohler Illumination Coaxial Coarse & Fine Focusing
  Output	USB2.0/3.0	USB2.0/3.0	USB2.0/3.0	USB2.0/3.0
  Software	Win XP/7/8/10	Win XP/7/8/10	Win XP/7/8/10	Win XP/7/8/10

• Microscope	Optical Microscope	Electron Microscope	Scanning Probe Microscope
  Max Resolution (um)	0.18	0.00011	0.00008
  Remark	Oil immersion 1500x	Imaging diamond carbon atoms	Imaging high-order graphitic carbon atoms

• Probe-Sample Interaction	Measure Signal	Information
  Force	Electrostatic Force	Shape
  Tunnel Current	Current	Shape, Conductivity
  Magnetic Force	Phase	Magnetic Structure
  Electrostatic Force	Phase	charge distribution

• 	Resolution	Working Condition	Working Temperation	Damge to Sample	Inspection Depth
  SPM	Atom Level 0.1nm	Normal, Liquid, Vacuum	Room or Low Temperation	None	1~2 Atom Level
  TEM	Point 0.3~0.5nm Lattice 0.1~0.2nm	High Vaccum	Room Temperation	Small	Usually <100nm
  SEM	6-10nm	High Vaccum	Room Temperation	Small	10mm @10x 1um @10000x
  FIM	Atom Level 0.1nm	Super High Vaccum	30~80K	Damge	Atom Thickness

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