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OPTO-EDU A63.7230 Scanning Transmission Electron Microscope STEM 50KV 800000x

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OPTO-EDU A63.7230 Scanning Transmission Electron Microscope STEM 50KV 800000x

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Brand Name :	CNOEC, OPTO-EDU
Model Number :	A63.7230
Certification :	CE, Rohs
Price :	FOB $1~1000, Depend on Order Quantity
Payment Terms :	T/T, West Union, Paypal
Supply Ability :	5000 pcs/ Month
Delivery Time :	5~20 Days

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OPTO-EDU A63.7230 Scanning Transmission Electron Microscope STEM 50KV 800000x

1x-500x Optical, 500x-800000x STEM, High Resolution 1.0nm@50kV, Support BF/DF
Brand New Design 5 Samples Loading System, One Set Up Applied To All Samples Easily
Ultra High-Speed Image Acquisition 100MB/s, Single 24k x 24k Image Captuer In 6.5s
Scan & Stitch Full FOV Large Image, Independent Operation of Large Field and High-Resolution Imaging
AI Micro-Particle Imaging Analysis Software Support Ultra Large FOV 100um@25nm, High Efficiency Recognition & Measure

Rapid Automatic Micro-Particle Imaging Analysis System

A63.7230 is a fast, intelligent, fully automated scanning transmission electron microscope (STEM) with complete independent intellectual property rights at 50KV. It meets the application needs in fields such as virus morphology observation, vaccine cell bank safety testing, vaccine research and manufacturing, clinical pathological tissue slice research, and biological research on brain neural connect omics.

A63.7230 Core Technology

◉ High Resolution High Brightness Electron Optical System

100M/s ultra high-speed imaging at 50KV. The system has video-level (25fps@2k*2k) nanoscale analysis capability, allowing for fully automated information acquisition without omissions while maintaining high resolution.

◉ High Sensitivity Direct Electron Detector

All detectors of A63.7230 use independently designed direct electron detectors, which convert electrons directly into electrical signals, achieving a detection efficiency of over 80% and a higher signal-to-noise ratio (SNR).

◉ Rapid Switching Between Large Field and High-Resolution Imaging

Innovative electron optical design allows large field imaging and high-resolution imaging to operate independently, enabling rapid switching, precise particle identification and positioning, and quick high-resolution imaging.

◉ High Speed and High Stability Mechanical Motion Platform

Uses a vibration-free motion platform, X=±4mm, Y=±4mm, positioning accuracy 1um.

A63.7230 Transmission Scanning Electron Microscope (STEM)
Resolution	1.0nm@50kV
(1nA beam current, under optimal conditions)	1.0nm@50kV
Imaging Mode	BF/DF (Bright Field/Dark Field)
STEM Mode Landing Voltage	50KV
Detector Type	Semiconductor Direct Detector
Magnification	1X-500X (Low Magnification Optical Imaging)
Magnification	500X - 800,000X (STEM Images)
Electron Gun	Schottky Type Thermal Field Emission
Electron Beam Current	50pA to 100nA
Sample Stage	X=±4mm, Y=±4mm, Positioning Accuracy 1um
Imaging Flux	Can complete imaging of a 1x1mm² area at 4nm pixel within 0.5 hours
Ultra High-Speed Image Acquisition	100MB/s, a single 24k x 24k image takes only 6.5s to capture
Acquisition Method	STEM Bright Field (BF) or Dark Field (DF) Acquisition
High Throughput Electron Microscope Control Software	Equipped with automatic image optimization, intelligent focus tracking, panoramic optical navigation, and large area fully automated acquisition functions
Rapid Switching Between Large Field and High-Resolution Imaging	Innovative electron optical design, independent operation of large field imaging and high-resolution imaging, rapid switching, precise particle identification and positioning, rapid high-resolution imaging
Image Analysis Processing Software AI Server	Ultra-large field imaging, 100um@25nm, AI Server high efficiency recognition and measurement
High Throughput Particle Quantitative Detection Capability	Brand new sample loading system and automated sample management system, ensuring quantitative detection

▶ Optical System Designed for Fully Automated Micro Particle Detection

Traditional transmission electron microscopes have a small field of view, which cannot meet the detection and identification needs of a large number of nanoparticles. A63.7230 is designed based on semiconductor industrial-grade electron beam detection equipment concepts, achieving high-throughput nanoparticle detection capabilities.

A63.7230 achieves ultra high-speed imaging through innovative designs such as fast imaging technology, vibration-free sample stage, high-speed electron optical system, and AI technology, with imaging speeds reaching dozens of times that of traditional electron microscopes.

▶ Fully Automated Design

A series of actions such as power-on inspection, navigation positioning, one-click centering, focus adjustment, and shift correction are automated. The real-time focus tracking system is composed of hardware and software. Using precise electronic deflection to achieve accurate positioning of sample images, resulting in high repeatability of results. It not only eliminates the need for extensive effort to adjust and locate sample positions but also utilizes AI intelligence for automatic detection, ultimately achieving unattended continuous operation.

▶ Customizable Software Functions for Different Clients

Leveraging modern artificial intelligence, AI algorithms, etc., to assist experimental personnel in analysis, from front-end sample preparation to automatic full-section imaging and stitching by the electron microscope, generating high-resolution maps, and then to back-end data processing. AI intelligent analysis can be used for automatic detection and classification of particles, providing users with a complete solution.

OPTO-EDU A63.7230 Scanning Transmission Electron Microscope STEM 50KV 800000x

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