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OPTO-EDU A63.7003 Tungsten Filament Scanning Electron Microscope SE BSE 360000x 4nm@20KV

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OPTO-EDU A63.7003 Tungsten Filament Scanning Electron Microscope SE BSE 360000x 4nm@20KV

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Brand Name :	CNOEC, OPTO-EDU
Model Number :	A63.7003
Certification :	CE, Rohs
Price :	FOB $1~1000, Depend on Order Quantity
Payment Terms :	T/T, West Union, Paypal
Supply Ability :	5000 pcs/ Month
Delivery Time :	5~20 Days

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OPTO-EDU A63.7003 Tungsten Filament Scanning Electron Microscope SE BSE 360000x 4nm@20KV

Magnification 360000x, Resolution 4nm@20KV(SE) With Detector SE+BSE+CCD, Optional EDS
Standard X/Y Motorized Working Stage, Optional 3 Axis Stage XYZ, XYT, 5 Axis Stage XYZRT
Built-in Condenser No Need Manual Adjust Aperture (LaB6 Optional)
High Vaccum System With Mechanical Rotary Pump To Get Vaccum In 30s
One Key Auto Focus, Auto Brightness & Contrast Adjust, No Need Shock Absorbing Table

A63.7003 Desktop Scanning Electron Microscopes (SEM) incorporate numerous innovative technologies, offering not only excellent imaging performance but also portability, catering to a wide range of application needs. Both domestically and internationally, the ZEM series, with its high-end positioning and diverse models, has achieved advanced standards in imaging clarity, user-friendliness, and system integration.

A63.7003 is renowned for its high level of integration and flexible configuration options. The user interface is simple, easy to learn, and operate, allowing even non-expert users to quickly become proficient. The accompanying software supports the entire workflow, from sample preparation, parameter adjustment, to image analysis, providing an integrated and efficient solution. A63.7003 has demonstrated strong analytical capabilities across multiple fields such as new materials, new energy, biomedicine, and semiconductors, assisting researchers in exploring the mysteries of the microscopic world. Due to its excellent cost-performance ratio, the ZEM series has become a preferred choice for many universities, research institutions, and enterprises seeking a desktop scanning electron microscope.

The A63.7003 benchtop SEM utilizes a wider range of accelerating voltages, 1Kvsteps, and a maximum magnification of 360,000x with a resolution of up to 5nmThe tabletop deceleration mode allows real-time observation of low-conductivity products without the need for gold spraying. The extra-large sample compart-ment can be integrated with a wide range of in-situ expansion platforms to meet different experimental and inspection needs.

Working Conditions:

Environmental requirements: small size, the whole machine can be placed on an ordinary laboratory table, no need to be equipped with an additional shock absorbing table.

1.Power supply 220V, 50Hz, 1KW

2.Temperature: Operating ambient temperature: 15°C-30°C

3.Humidity: <80%RH

Main Specification:

1. Acceleration voltage: 3-20kV, continuously adjustable.

2. Electron gun type: pre-aligned tungsten filament, life time 100 hours, easy to replace by user, highly integrated two-stage gun lens, no need to manually adjust the diaphragm of the objective lens.

3. Magnification ≥360000X；

4. Resolution:≤4nm@20KV

5. Detector: secondary electron detector (SE), quadruple backscatter detector (BSE),

6. Stage: 2 Axis XY motorized stage, moving 60x55mm；

7. Maximum sample size: 100*78*68.5mm while XY axes move freely

8. Sample change and high vacuum pumping time≤ 30s.

9. High vacuum system: built-in turbo molecular pump, external mechanical pump, the vacuum in sample chamber ≥1x10-1Pa, fully automatic control;

10. Video mode ≥512x512 pixels, no need for small window scanning.

11. Quick scan mode: imaging time≤3s, 512x512 pixels.

12. Slow scan mode: imaging time≤40s, 2048x2048 pixels.

13. Image File: BMP, TIFF, JPEG, PNG.

14. One-key automatic adjustment of brightness and contrast, auto-focus, large image stitching

15. Navigation function: optical camera navigation and cabin camera.

16. Image measurement function: distance, angle, etc.

17. Including computer & software, mouse control.

18. Optional:

--Tungsten filament (20pcs/box)

--EDS

--3 Axis Motorized Stage XYZ

--3 Axis Motorized Stage XYT

--5 Axis Motorized Stage XYZRT

--Low vacuum (1-100Pa)

--Deceleration Mode, 1-10KV, can observe non-conductor or poor conductivity samples without gold spraying, only for BSE mode

--In-Situ stage from original factory, heating, cooling, stretch, etc.

--Shock-absorbing Platform (recommend for A63.7003)

19.Microscope size 650*370*642mm, mechanical pump size 340*160*140mm

Model	A63.7001	A63.7002	A63.7003	A63.7004	A63.7005
Resolution	10nm@15KV	6nm@18KV	4nm@20KV	3nm@20KV	2.5nm@15KV
Magnification	150000x	200000x	360000x	360000x	1000000x
Electron Gun	Tungsten	Tungsten	Tungsten	LaB6	Schotty FEG
Voltage	5/10/15KV	3-18KV	3-20KV	3-20KV	1-15KV
Detector	BSE+SE	BSE+SE	BSE+SE	BSE+SE	BSE+SE
Navigation CCD	CCD	CCD	CCD+Cabin Camera	CCD+Cabin Camera	CCD+Cabin Camera
Vaccum Time	90s	90s	30s	90s	180s
Vaccum System	Mechanical Pump Molecular Pump	Mechanical Pump Molecular Pump	Mechanical Pump Molecular Pump	Mechanical Pump Molecular Pump Ion Pump	Mechanical Pump Molecular Pump Ion Pump x2
Vaccum	High Vaccum 1x10-1Pa	High Vaccum 1x10-1Pa	High Vaccum 1x10-1Pa	High Vaccum 5x10-4Pa	High Vaccum 5x10-4Pa
Stage	XY Stage, 40x30/40x40mm	XY Stage, 40x30/40x40mm	XY Stage, 60x55mm	XY Stage, 60x55mm	XY Stage, 60x55mm
Stage Precision	-	Position Precise 5um
Working Distance	5-35mm	5-35mm	5-73.4mm	5-73.4mm	5-73.4mm
Max Specimen	80x42x40mm	80x42x40mm	100x78x68.5mm	100x78x68.5mm	100x78x68.5mm
Optional	Tungsten Filament 20 pcs/box			Lab6 Filament	Field Emission Lamp
	EDS Oxford AZtecOne with XploreCompact 30
	-	Low Vaccum 1-100Pa		Low Vaccum 1-30Pa
	-	Z Axis Module	3 Axis Stage, X 60mm, Y 50mm, Z 25mm
	-	T Axis Module	3 Axis Stage, X 60mm, Y 50mm, T ±20°
	-	-	5 Axis Stage, X 90mm, Y 50mm, Z 25mm, T ±20°, R 360°
	-	-	Shock-absorbing Platform, For 3 Axis, 5 Axis Stage
	-	Deceleration Mode 1-10KV To Watch Non-conduct Samples, Only For BSE
	-	In-Situ Stage From Original Factory, Heating, Cooling, Stretch, etc.
	UPS

▶ AZtecOne with XploreCompact 30 for TTM

System Conventional Eds Analysis

The system provides qualitative and quantitative analysis of different materials, analyzing elements ranging from B(5) to cf (98).in addition to individual point scans of the sample surface, powerful line scans and elemental spec-tral scans are also available. combined with a customized detector, analysis and reporting can be done in seconds.

Effective Crystal Area	30mm2	Resolution (Of A Photo)	Mn Ka <129eV @50,000cps
Elemental Detection Range	B (5) to cf (98)	Maximum Input Count Rate	>1,000,000 cps

OPTO-EDU A63.7003 Tungsten Filament Scanning Electron Microscope SE BSE 360000x 4nm@20KV

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